DEPENDENCE OF BARKHAUSEN NOISE ON FILM PARAMETERS IN SHIELDED MR HEADS

Citation
M. Ramesh et al., DEPENDENCE OF BARKHAUSEN NOISE ON FILM PARAMETERS IN SHIELDED MR HEADS, IEEE transactions on magnetics, 29(6), 1993, pp. 3817-3819
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
29
Issue
6
Year of publication
1993
Part
2
Pages
3817 - 3819
Database
ISI
SICI code
0018-9464(1993)29:6<3817:DOBNOF>2.0.ZU;2-X
Abstract
Barkhausen discontinuities in read waveforms from shielded MR heads ha ve been isolated and analyzed using histograms and statistical methods , The data obtained has been found to be dependent on the test conditi ons and previous magnetic histories in addition to the magnetic proper ties of the element. For the heads studied, the Barkhausen noise is fo und to be affected primarily by easy axis misorientation, input flux e xcitation amplitude, element aspect:ratio and magnetic history and les s so by magnetostriction coefficient.