Sw. Gao et al., THEORETICAL INVESTIGATION OF THE MECHANISM FOR XE TRANSFER IN THE ATOMIC SWITCH, Journal of electron spectroscopy and related phenomena, 64-5, 1993, pp. 665-670
The mechanism of a reversible Xe transfer in the atomic switch is theo
retically investigated. It is demonstrated that Xe transfer is caused
by inelastic scattering from the tunneling electrons, leading to vibra
tional excitation in one of the potential well and transfer of it to t
he deeper well. The transfer rate, essentially determined by the vibra
tional excitation, has a power law dependence on the bias, where the p
ower equals approximately the number of levels in the potential. The c
oupling to the electric field and the elastic scattering by the tunnel
ling electrons introduce a potential difference between the double wel
l, which affects the direction of Xe transfer.