ACCELERATED COMPUTATION OF ADMITTANCE PARAMETERS FOR PLANAR WAVE-GUIDE JUNCTIONS

Admittance parameters are widely employed to characterize the electrom agnetic behavior of arbitrary planar waveguide junctions, Even though strong efforts have been devoted to the development of simple and effi cient procedures for evaluating such parameters, it is still very impo rtant to further reduce the computation time required when analyzing w aveguide systems as they become more complex, This article describes a simple and very fast procedure for computing the admittance parameter s of planar waveguide junctions, The key feature of this procedure is that the frequency dependence of the admittance parameters is extracte d from all infinite sums, As a result, only a few terms need to be eva luated at each frequency point thereby substantially reducing the comp utational effort. (C) 1997 John Wiley & Sons, Inc.