STUDIES ON YBCO AND BSCCO THICK-FILM RF-SQUIDS AT LIQUID-NITROGEN TEMPERATURES

Citation
S. Khare et al., STUDIES ON YBCO AND BSCCO THICK-FILM RF-SQUIDS AT LIQUID-NITROGEN TEMPERATURES, Indian Journal of Pure & Applied Physics, 32(1), 1994, pp. 39-48
Citations number
NO
Categorie Soggetti
Physics
ISSN journal
00195596
Volume
32
Issue
1
Year of publication
1994
Pages
39 - 48
Database
ISI
SICI code
0019-5596(1994)32:1<39:SOYABT>2.0.ZU;2-2
Abstract
RF-SQUID behaviour in YBCO and BSCCO thick films has been studied by p atterning a hole interrupted with a microbridge type of structure on t he films. YBCO film used for the rf-SQUID fabrication had mixed orient ation with T(c)(R = O) of 91 K, whereas BSCCO film had predominantly c -axis oriented high-T(c) 2223 phase with T(c)(R = O) of 104 K. Voltage -flux (V-PHI) modulations in YBCO rf-SQUID have been observed up to 85 .1 K, whereas, in BSCCO rf-SQUID, the modulations were present up to 9 8 K. Both the SQUIDs have been operated successfully in flux-locked-lo op mode at 77 K. Both YBCO and BSCCO rf-SQUIDs showed single periodici ty in V-PHI modulations corresponding to the area of the SQUID loop. F lux noise density, square-root S(PHI) almost-equal-to 5 x 10(-4) PHI(o )/square-root Hz for BSCCO rf-SQUID is found to be less than YBCO rf-S QUID (1 X 10(-3) PHI(o)/square-root Hz) at 77 K in the white noise reg ion (f > 1 Hz). As compared to YBCO rf-SQUID, BSCCO rf-SQUID has been found to be more stable even after several thermal cycling.