LATCHING CHARACTERISTICS OF A CMOS BISTABLE REGISTER

Authors
Citation
Eg. Friedman, LATCHING CHARACTERISTICS OF A CMOS BISTABLE REGISTER, IEEE transactions on circuits and systems. 1, Fundamental theory andapplications, 40(12), 1993, pp. 902-908
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
10577122
Volume
40
Issue
12
Year of publication
1993
Pages
902 - 908
Database
ISI
SICI code
1057-7122(1993)40:12<902:LCOACB>2.0.ZU;2-Q
Abstract
Closed-form solutions describing the output response of a CMOS bistabl e register are presented. From these results, the fundamental latching behavior of a CMOS register is developed in terms of its physical and circuit characteristics. Necessary and sufficient conditions for latc hing data are described in terms of small signal circuit parameters. F rom these necessary and sufficient conditions, the limiting requiremen t for latching, which provides the minimum set-up time and conditions for defining the onset of metastability, is presented and verified.