DEVELOPMENT OF A NEW X-RAY RADIOGRAPHY SYSTEM WITH 16 AMORPHOUS-SILICON LINEAR SENSORS

A new X-ray radiography system has been developed using multiple amorp hous silicon linear sensors combined with a Gd2O2S phosphor sheet. 16 line sensors are aligned parallel with a spacing of 19 mm and are scan ned 20 mm to cover an X-ray image. Scanning step is 0.5 mm and accumul ation time can be selected from 33 ms to 200 ms per one step. Total ac tive area of 25.6 cm X 30.0 cm with 512 X 608 pixels was realized. The practical problem of this system is caused by the sensitivity variati ons among sensors, which has been overcome by adopting a multi-level i ntensity calibration method with a spatially uniform X-ray irradiation . Availability of this system to X-ray radiography has been demonstrat ed through some medical applications. This system offers a promising c ompact X-ray imaging system in place of conventional X-ray films.