NANOMETER-RESOLUTION DISTANCE MEASUREMENT WITH A NONINTERFEROMETRIC METHOD

Authors
Citation
Kl. Deng et Jp. Wang, NANOMETER-RESOLUTION DISTANCE MEASUREMENT WITH A NONINTERFEROMETRIC METHOD, Applied optics, 33(1), 1994, pp. 113-116
Citations number
9
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
33
Issue
1
Year of publication
1994
Pages
113 - 116
Database
ISI
SICI code
0003-6935(1994)33:1<113:NDMWAN>2.0.ZU;2-K
Abstract
We have developed a noninterferometric technique for high-resolution d istance measurement (optical ranging). The technique utilizes the fact that the wavelength of a broadband cw laser can be changed by externa l feedback. By placing the ranging target near the focal point of a mi croscope objective, we can make the feedback from the target, hence th e laser wavelength, sensitive to the target position. The target posit ion is determined from the laser wavelength with great resolution. In our experiments a 20-nm resolution is obtained. The resolution is limi ted by the instrumental resolution and mechanical stability of the exp erimental setup.