V. Malina et al., TECHNOLOGICAL ASPECTS OF THE PREPARATION OF AU-ZN OHMIC CONTACTS TO P-TYPE INP, Semiconductor science and technology, 9(1), 1994, pp. 49-53
Au-Zn/Au and X/Au-Zn/Y/Au metallizations (where X = Au, Cr or Ni is a
nucleation layer and Y = Cr or Ni is a diffusion barrier), formed by v
acuum evaporation of Au-Zn (10 wt%) alloy, were studied for the prepar
ation of ohmic contacts to p-type InP. The metallurgical and electrica
l properties of such contacts were investigated as a function of depos
ition parameters (especially the deposition rate of Au-Zn alloy) and a
lloying conditions. The role of the nucleation layer X on the InP surf
ace and of the barrier layer Y between the Au-Zn and the outer Au laye
r in contact formation is also discussed.