Electrical measurements of the equilibrium np product (n(ie)(2)) in he
avily doped n- and p-GaAs were performed. The n(ie)(2)D product (where
D is the diffusivity) was measured by fitting the collector current-v
oltage characteristic of a homojunction bipolar transistor to an ideal
diode equation modifed to account for transport in thin base transist
ors. The n(ie)(2) product was then extracted from n(ie)(2) by utilizin
g diffusivity results obtained with the zero-field time-of-flight tech
nique. Our results show significant effective band-gap shrinkage in he
avily doped p-GaAs, and very little effective band-gap shrinkage in he
avily doped n-GaAs. At extremely heavy dopings, an effective band-gap
widening is observed for both n- and p-GaAs and is attributed to the e
ffects of degeneracy.