EXPERT-SYSTEM FOR THE VOLTAMMETRIC DETERMINATION OF TRACE-METALS .3. METHODS FOR DETERMINING MERCURY, SELENIUM AND VANADIUM

Citation
M. Esteban et al., EXPERT-SYSTEM FOR THE VOLTAMMETRIC DETERMINATION OF TRACE-METALS .3. METHODS FOR DETERMINING MERCURY, SELENIUM AND VANADIUM, Analytica chimica acta, 284(2), 1993, pp. 435-443
Citations number
24
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032670
Volume
284
Issue
2
Year of publication
1993
Pages
435 - 443
Database
ISI
SICI code
0003-2670(1993)284:2<435:EFTVDO>2.0.ZU;2-C
Abstract
A previously described expert system for the voltammetric determinatio n of Cu, Zn, Cd, Pb, In, Ni, Co and Tl is enhanced and improved by mea ns of the addition of methods for Hg, V and Se (optionally also Te). S pecial attention is paid to the determination of V, inside a wide conc entration range, in different types of samples. The system guides the user in the choice of sample treatment and the most appropriate voltam metric procedure for the identification and the quantification of the trace metals. The techniques implemented are differential pulse polaro graphy, anodic stripping voltammetry, cathodic stripping voltammetry a nd adsorptive stripping voltammetry, using mercury drop electrodes and a gold electrode (for the determination of Hg). For the identificatio n and resolution of overlapping peaks (Cd and In), the system may call two external programs, written in turboBasic. Quantification is carri ed out by means of the multiple standard addition method, and the qual ity of the calibration plot is tested by several statistical validatio n tests. The expert system is developed using KES (knowledge engineeri ng system).