H. Shirai et al., IN-SITU UV-VISIBLE AND INFRARED ELLIPSOMETRY STUDY OF THE INFLUENCE OF SILANE DILUTION ON THE GROWTH OF HYDROGENATED AMORPHOUS-SILICON, Journal of non-crystalline solids, 166, 1993, pp. 119-122
The initial stages of hydrogenated amorphous silicon growth from the R
F glow discharge decomposition of pure silane and mixtures of silane w
ith H-2 or He has been studied using UV-visible and infrared ellipsome
try. The substrate as well as the gas phase conditions strongly influe
nce the early stages of a-Si:H growth. As compared to pure silane cond
itions, when using H-2 or He dilution of silane, thicker films must be
deposited for SIH bonding to become dominant with respect to SiH2. Mo
reover, in the case of high deposition rates from silane-helium mixtur
es, the SiH2 band increases with film thickness, indicating that, cont
rary to low deposition rate conditions, SiH2 is present in the bulk of
the film.