IN-SITU UV-VISIBLE AND INFRARED ELLIPSOMETRY STUDY OF THE INFLUENCE OF SILANE DILUTION ON THE GROWTH OF HYDROGENATED AMORPHOUS-SILICON

Citation
H. Shirai et al., IN-SITU UV-VISIBLE AND INFRARED ELLIPSOMETRY STUDY OF THE INFLUENCE OF SILANE DILUTION ON THE GROWTH OF HYDROGENATED AMORPHOUS-SILICON, Journal of non-crystalline solids, 166, 1993, pp. 119-122
Citations number
10
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
166
Year of publication
1993
Part
1
Pages
119 - 122
Database
ISI
SICI code
0022-3093(1993)166:<119:IUAIES>2.0.ZU;2-U
Abstract
The initial stages of hydrogenated amorphous silicon growth from the R F glow discharge decomposition of pure silane and mixtures of silane w ith H-2 or He has been studied using UV-visible and infrared ellipsome try. The substrate as well as the gas phase conditions strongly influe nce the early stages of a-Si:H growth. As compared to pure silane cond itions, when using H-2 or He dilution of silane, thicker films must be deposited for SIH bonding to become dominant with respect to SiH2. Mo reover, in the case of high deposition rates from silane-helium mixtur es, the SiH2 band increases with film thickness, indicating that, cont rary to low deposition rate conditions, SiH2 is present in the bulk of the film.