U. Dammer et al., THE EFFECT OF HYDROGENATION ON THE ELECTRONIC-PROPERTIES OF AMORPHOUSSILICON-NICKEL ALLOYS NEAR THE METAL-INSULATOR-TRANSITION, Journal of non-crystalline solids, 166, 1993, pp. 501-504
The temperature dependence of the electrical conductivity of two sets
of amorphous silicon-nickel alloys, one of which is hydrogenated, is p
resented. The results have been analysed in an attempt to determine th
e nature of the conduction processes. For metallic samples, evidence i
s obtained for quantum interference mediated by inelastic scattering a
nd also for the existence of electron-electron interactions. On the in
sulating side of the metal-insulator transition, transport occurs in l
ocalized states, but the results cannot be convincingly explained in t
erms of conventional variable-range hopping theories, even when Coulom
b effects are included. The effect of hydrogenation is to raise the me
tal concentration required to reach the metallic state.