ATOMIC-FORCE MICROSCOPE - A NEW TOOL FOR IMAGING CRYSTAL-GROWTH PROCESSES

Citation
Pe. Hillner et al., ATOMIC-FORCE MICROSCOPE - A NEW TOOL FOR IMAGING CRYSTAL-GROWTH PROCESSES, Faraday discussions, (95), 1993, pp. 191-197
Citations number
25
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
13596640
Issue
95
Year of publication
1993
Pages
191 - 197
Database
ISI
SICI code
1359-6640(1993):95<191:AM-ANT>2.0.ZU;2-W
Abstract
We present real-time and in situ atomic force microscope (AFM) observa tions of solution growth on the cleavage plane of two minerals, calcit e and fluorite. Different growth behaviours are exhibited: the calcite surface grows via a layer-spiral mechanism, while the fluorite surfac e grows via the formation of sharp asperities. The difference in behav iour of the two minerals may be linked to the lack of local charge neu trality on the fluorite surface. The growth mechanisms observed on cal cite and fluorite provide insight into the expected behaviour of a wid e range of salts important in nature and industry.