SURFACE-ANALYSIS OF FLOATGLASS BY MEANS OF X-RAY-ABSORPTION, REFLECTION, AND FLUORESCENCE ANALYSIS

The surface structure of the top and bottom sides of floatglass are in vestigated by x-ray absorption, reflection, and fluorescence at grazin g incidence. The data analysis includes the determination of the thick ness, density, and interface roughness of surface layers and the depth profiling of different atomic species. Expressions for the reflectivi ty and the fluorescence from a substrate and from layers on a substrat e are given and discussed in detail, with special emphasis on the infl uence of interface roughness on these quantities. It turns out that ir on and tin are enriched on the bottom side of the floatglass. In addit ion, iron changes its valence with depth. Leaching the glass for 48 da ys in NaOH has a strong influence on the iron concentration, on the su rface density, and on the surface roughness of the glass.