Ni-P coated Al-Mg (Ni-P) and glass-ceramic (GC) substrates for magneti
c recording are measured by an atomic force microscope (AFM) using dif
ferent scan sizes and sampling resolution. AFM measurements of the Ni-
P and GC surfaces reveal finer and finer details as the sampling inter
val decreases and that the GC surface contains more high frequency det
ails than the Ni-P surface. A three-dimensional numerical rough surfac
e contact model (X. Tian and B. Bhushan, ASME J. Tribol., 118 (1996) 3
3-42) is used to perform contact analysis on the Ni-P and GC surfaces
to study the effect of sampling resolution on contact pressure and con
tact area. The contact analysis shows that contact pressure increases
and contact area decreases as the sampling interval decreases and aspe
rity contact starts from plastic deformation, the scale of which depen
ds on the different surface topographical structures. The analysis als
o shows that a high frequency structure will facilitate plastic deform
ation which is not desired for head/disk durability. The stiction in r
ough surface contact problem is also considered using a numerical stic
tion model (X. Tian and B. Bhushan, J. Phys. D: Appl. Phys., 29 (1996)
163-178). The stiction model is used to highlight how stiction can be
assessed by the bearing ratio of a surface and how stiction is affect
ed by the skewness of surface height distribution. Stiction analysis o
n two GC surfaces with different skewness shows that a surface with po
sitive skewness has less stiction. A uniform patterned texture with an
optimum number of identical asperities (such as produced by laser tex
turing) appears to be an ideal surface.