A study has been made of the transverse stretching of poly(ethylene te
rephthalate) film previously drawn longitudinally at constant force an
d width. The crystalline phase has been characterized using wide-angle
X-ray diffraction: the orientation of the chain axis and the normal t
o the phenylene ring have been determined, as well as the crystallite
size. Infra-red spectroscopy and refractive index measurements have be
en used to characterize the orientation of the material averaged over
the crystalline and amorphous phases. The results showed that the crys
tals, which were preferentially aligned with their chain axes along th
e first stretching (longitudinal) direction, break down during the sec
ond drawing and that recrystallization takes place to produce crystall
ites with their c-axes aligned along the transverse stretching directi
on. The observed increase in the tendency for the normal to the phenyl
ene ring to be normal to the film plane correlates with the increase i
n crystallite size along the chain axis for crystallites oriented with
their chain axes in the transverse direction.