E. Goering et al., ANGLE-DEPENDENT SOFT-X-RAY ABSORPTION-SPECTROSCOPY OF V2O5, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 75(2), 1997, pp. 229-236
We have measured the V 2p(3/2) and O Is X-ray absorption spectra of si
ngle-crystal V2O5 and compared them with linear-combination-of-atomic-
orbitals density-of-states (DOS) calculations. The spectra change dram
atically with incident angle and the use of polarized light and a sing
le crystal limits the number of transitions possible, revealing spectr
al features that cannot be resolved using polycrystals (angle integrat
ed). The measured O 1s and V 2p(3/2) spectra agree with the projected
unoccupied O 2p and V 3d DOSs respectively, indicating that atomic eff
ects alone cannot adequately describe the absorption spectrum, but tha
t solid-state effects, including V-O hybridization, must be included.