ANGLE-DEPENDENT SOFT-X-RAY ABSORPTION-SPECTROSCOPY OF V2O5

Citation
E. Goering et al., ANGLE-DEPENDENT SOFT-X-RAY ABSORPTION-SPECTROSCOPY OF V2O5, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 75(2), 1997, pp. 229-236
Citations number
23
Categorie Soggetti
Physics, Applied",Mechanics,"Physics, Condensed Matter","Material Science
ISSN journal
13642812
Volume
75
Issue
2
Year of publication
1997
Pages
229 - 236
Database
ISI
SICI code
1364-2812(1997)75:2<229:ASAOV>2.0.ZU;2-G
Abstract
We have measured the V 2p(3/2) and O Is X-ray absorption spectra of si ngle-crystal V2O5 and compared them with linear-combination-of-atomic- orbitals density-of-states (DOS) calculations. The spectra change dram atically with incident angle and the use of polarized light and a sing le crystal limits the number of transitions possible, revealing spectr al features that cannot be resolved using polycrystals (angle integrat ed). The measured O 1s and V 2p(3/2) spectra agree with the projected unoccupied O 2p and V 3d DOSs respectively, indicating that atomic eff ects alone cannot adequately describe the absorption spectrum, but tha t solid-state effects, including V-O hybridization, must be included.