Jk. Yoon et al., VOLTAGE-DEPENDENCE OF OFF CURRENT IN A-SI-H TFT UNDER BACKLIGHT ILLUMINATION, Journal of non-crystalline solids, 166, 1993, pp. 747-750
We have studied the off currents of a-Si:H TFT at negative gate voltag
es, The voltage dependence of the off current in a-Si:H TFT is explain
ed as the hole current limited by two competing components, channel co
nductance due to hole accumulation and the drain junction conductance
under backlight illumination, When enough carriers are injected from t
he source and drain regions by photogeneration, two quite different ga
te voltage dependences appeared, In the dark condition the increasing
off current with negative gate bias is the hole current injected from
the drain junction region, and the hole generation seems to originate
from the thermally-assisted tunneling via the localized states in a-Si
:H near the drain junction because of its small activation energy of 0
.1 similar to 0.2 eV.