Layers of AlBN were grown on sapphire by organometallic vapor-phase ep
itaxy at 1050 degrees C using triethylboron, trimethylaluminum, and am
monia as precursors. It is shown that boron is readily incorporated in
to the layers and its concentration in the solid phase can be as high
as 40%. However, single phase Al1-xBxN films can only be grown for com
positions not exceeding x=0.01. For higher boron concentrations in the
solid the second B-rich phase is formed. This phase was identified as
wurtzite BN based on the results of transmission electron microscopy
and x-ray diffraction. The growth of this thermodynamically unfavorabl
e phase becomes possible, most probably, because it occurs within the
framework provided by wurtzite AlN islands first formed on the surface
and setting up the sites for lateral growth of wurtzite BN. That lead
s to formation of columnar structure of AlN and BN crystallites orient
ed in the basal plane and existing side by side. (C) 1997 American Ins
titute of Physics.