The effects of microwave fields on recombination processes, which are
responsible for the optical detection of cyclotron resonance (ODCR) in
4H and 6H SiC epitaxial layers, have been investigated. We present ex
perimental evidence indicating that the dominant mechanism of ODCR in
SiC, at low temperatures and in a common range of microwave power (<20
0 mW), is microwave-induced lattice heating under the cyclotron resona
nce conditions. The results also show that at low temperatures and low
microwave power the dominant scattering mechanism is impurity scatter
ing, while carrier scattering by lattice phonons dominates under high
microwave power conditions. (C) 1997 America Institute of Physics.