ANOMALOUS CAPACITANCE-VOLTAGE PROFILES IN QUANTUM-WELLS EXPLAINED BY A QUANTUM-MECHANICAL MODEL

Citation
S. Kundu et al., ANOMALOUS CAPACITANCE-VOLTAGE PROFILES IN QUANTUM-WELLS EXPLAINED BY A QUANTUM-MECHANICAL MODEL, Journal of applied physics, 81(4), 1997, pp. 2030-2032
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
4
Year of publication
1997
Pages
2030 - 2032
Database
ISI
SICI code
0021-8979(1997)81:4<2030:ACPIQE>2.0.ZU;2-6
Abstract
We have developed a quantum mechanical model for understanding and exp laining the capacitance-voltage (C-V) carrier profiles observed in qua ntum wells (QW). The external field imposed on the QW during C-V profi ling changes the carrier distribution of the system. This model consid ers the effects of field and quantum confinement of the carriers in th e well. The results obtained by iterative solutions of Schrodinger's a nd Poisson's equations give a better understanding of the experiments than the previous models where quantum confinement is ignored. (C) 199 7 American Institute of Physics.