The retarding field analyser (RFA) proved to be advantageous in electr
on spectroscopy due to its high luminosity and by providing LEED simul
taneously with AES and EPES. RFA is very efficient for determining the
inelastic mean free path of electrons by EPES. Dolinski et al measure
d the elastic peak by repelling the electron beam using a bias potenti
al on the sample. In this paper a further development of this procedur
e is described supplying the true percentage of elastically scattered
electrons collected by RFA. The percentage has been determined by our
RFA with optimized bias potential of the sample for primary energies b
etween 100 and 2000 eV. It was deduced from the high energy side of th
e elastic peak because the background affects the detected signal on t
he low energy side. The experimental curve of elastic reflection coeff
icient is presented for indium. The measured elastic peak is distorted
by the analyser. The spectrometer response of an RFA was determined b
y analysing the peak shape of deflected electrons after optimization o
f the bias voltage of the sample. The peak shape shows asymmetry since
the low energy side differs from the Gaussian like high energy side.
The distortion produced by RFA is similar to that observed by Taylor.
It is enhanced by the background adjacent to the elastic peak. A compu
ter algorithm was elaborated for reconstruction of the elastic and Aug
er peaks. Corrected curve is presented for indium Auger peak.