Tin nitride obtained by reactive magnetron sputtering was annealed at
several temperatures to study the thermal evolution and stability of t
he compound. X-ray diffraction, thermal effusion and conversion electr
on Mossbauer spectrometry were used to characterize the events. The ni
tride has different stabilities, depending on the ambient conditions u
nder which the annealings are performed. Apparently only one crystallo
graphic phase of the nitride is present before it disproportionates.