ACCELERATED LIFE TESTS FOR PRODUCTS OF UNEQUAL SIZE

Authors
Citation
Ds. Bai et Hj. Yun, ACCELERATED LIFE TESTS FOR PRODUCTS OF UNEQUAL SIZE, IEEE transactions on reliability, 45(4), 1996, pp. 611-618
Citations number
13
Categorie Soggetti
Computer Sciences","Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture","Computer Science Software Graphycs Programming
ISSN journal
00189529
Volume
45
Issue
4
Year of publication
1996
Pages
611 - 618
Database
ISI
SICI code
0018-9529(1996)45:4<611:ALTFPO>2.0.ZU;2-X
Abstract
This paper considers 'estimation of the lifetime distribution' and 'op timal design of constant-stress accelerated life test plans' for produ cts of unequal size. The distribution is Weibull with a scale paramete r that is a 'log-linear function of stress' and a 'power function of p roduct size with a size-effect parameter'. Maximum likelihood estimato rs (MLE) of model parameters are obtained, and their properties are st udied. Two stress-level optimal test plans are obtained for products t hat come in two sizes, and a table useful for finding optimal test pla ns is given. The sum of asymptotic variances of MLE of a specified qua ntile of the distributions for products of both sizes is used as the o ptimality criterion. Optimum plans can be used when the ratio of two s izes is not too large. When the ratio is very large, the pre-estimate of size effect parameter should be carefully chosen.