ATOM-PROBE FIELD-ION MICROSCOPY AND APPLICATIONS TO SURFACE SCIENCE

Atom-probe field ion microscopy is capable of imaging solid surfaces w ith atomic resolution, and at the same time chemically analyzing atoms selected by the observer from the atomic image. While the samples hav e to be restricted to those having a tip shape, this is becoming an ad vantage in many applications where a high electric field is needed. It s early developments and recent applications to surface science are br iefly described here.