EFFECT OF TIN ADDITION ON PROCESS OF SECO NDARY RECRYSTALLIZATION OF FE-3-PERCENT-SI

In order to clarify the effect of tin addition on the secondary recrys tallization of Fe-3%Si, the behavior of grain growth during secondaril y recrystallizing annealing was investigated by SEM-ECC-ECP method. Ti n addition accelerates remarkably (110) [001]-oriented secondary recry stallization. Tin is confirmed to segregate on the grain boundary of t he tin-added specimen. The (110) [001] grain is appproximately in the Sigma 9 coincidence orientation in relation to the {111} [112] grain, close to which the main orientation is located in primary matrix of th e specimen. It is considered that the relative migration rate of Sigma 9 coincidence boundaries comparing with other ones is increased throu gh the tin segregation.