ANGLE-RESOLVED PHOTOEMISSION-STUDY OF A SINGLE-DOMAIN SI(001)2X1-NA SURFACE WITH SYNCHROTRON-RADIATION

Citation
T. Abukawa et al., ANGLE-RESOLVED PHOTOEMISSION-STUDY OF A SINGLE-DOMAIN SI(001)2X1-NA SURFACE WITH SYNCHROTRON-RADIATION, Surface science, 303(1-2), 1994, pp. 146-152
Citations number
24
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
303
Issue
1-2
Year of publication
1994
Pages
146 - 152
Database
ISI
SICI code
0039-6028(1994)303:1-2<146:APOASS>2.0.ZU;2-V
Abstract
The electronic structures of a single-domain Si(001)2 X 1-Na surface a t a saturation coverage have been studied by angle-resolved photoelect ron spectroscopy (ARPES) with linearly polarized synchrotron radiation (SR). To determine the dispersion of surface states in detail, the AR PES spectra have been measured along several symmetry axes of the 2 X 1 surface Brillouin zone. The result revealed a new assignment of surf ace-state dispersions. Symmetry properties of upper surface-state band s are determined using a linearly polarized character of SR. It has be en found that the upper two surface states have the same symmetries as the dangling bond of the clean Si(001)2 X 1 dimer surface. The electr onic structure of the Si(001)2 X 1-Na surface determined here is very similar to that of the Si(001)2 X 1-K surface [Surf. Sci. 261 (1992) 2 17] and is consistent with that expected for an alkali double-layer mo del.