COSMIC-RAYS EFFECTS IN MICROELECTRONIC DE VICES

Authors
MUSSEAU O
Citation
O. Musseau, COSMIC-RAYS EFFECTS IN MICROELECTRONIC DE VICES, Onde electrique, 74(1), 1994, pp. 25-30
Citations number
NO
Categorie Soggetti
Telecommunications,"Engineering, Eletrical & Electronic
Journal title
Onde electrique → ACNP
ISSN journal
00302430
Volume
74
Issue
1
Year of publication
1994
Pages
25 - 30
Database
ISI
SICI code
0030-2430(1994)74:1<25:CEIMDV>2.0.ZU;2-D
Abstract
Cosmic rays are responsible for functional failures in spaceborne micr oelectronic devices. The different classes of failures are due to diff erent charge collection mechanisms when the ion track strikes devices elementary cells. A theoretical derivation of device sensitivity can b e obtained from the analysis of the physical structure of various micr oelectronic technologies.