K. Franke et al., MODIFICATION AND DETECTION OF DOMAINS ON FERROELECTRIC PZT FILMS BY SCANNING FORCE MICROSCOPY, Surface science, 302(1-2), 1994, pp. 120000283-120000288
A scanning force microscope (SFM) with light fiber sensor was construc
ted. The SFM operates in the repulsive contact mode. Three pictures ha
ve been measured simultaneously: the topography and the 1st and 2nd ha
rmonic. The 1st harmonic can be related to piezoelectricity and polari
zation. The 2nd harmonic is correlated with electrostriction and permi
ttivity. The conductive tip of the SFM was used to polarize lead zirco
nate titanate (PZT) films and to image their domain structure on a nan
ometer scale. In addition, a writing experiment has been performed.