Electric fatigue is a major obstacle for some potential applications o
f ferroelectric materials based on reversals of spontaneous polarizati
on, such as memory devices and high strain actuators. Our studies of f
ine-grained hot-pressed lead zirconate titanate with lanthanum dopant
(PLZT 7/68/32) show that fast fatigue is actually caused by contaminat
ed surfaces instead of intrinsic structure deterioration or the change
of domain states. All of the specimens with conventionally cleaned su
rfaces showed significant fatigue after 10(5) switching cycles, but sp
ecimens cleaned with a new cleaning procedure did not fatigue even aft
er more than 10(8) switching cycles. This type of fatigue is found to
be due to generated microcracking at the ceramic-electrode interface.