IMPROVED ATOMIC-FORCE MICROSCOPY RESOLUTION USING AN ELECTRIC DOUBLE-LAYER

Authors
SOKOLOV IY HENDERSON GS WICKS FJ OZIN GA
Citation
Iy. Sokolov et al., IMPROVED ATOMIC-FORCE MICROSCOPY RESOLUTION USING AN ELECTRIC DOUBLE-LAYER, Applied physics letters, 70(7), 1997, pp. 844-846
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
70
Issue
7
Year of publication
1997
Pages
844 - 846
Database
ISI
SICI code
0003-6951(1997)70:7<844:IAMRUA>2.0.ZU;2-P
Abstract
High resolution (''atomic'') images of clinochlore and muscovite have been obtained in aqueous solution by inducing an electric double layer between the atomic force microscope tip and the sample surface. The e lectric double layer is created by the addition of a surfactant to wat er and gnarly improves image resolution, A theoretical model is propos ed to explain the improved resolution. (C) 1997 American Institute of Physics.