M. Marsi et al., SURFACE-STATES AND SPACE-CHARGE LAYER DYNAMICS ON SI(111)2X1 - A FREE-ELECTRON LASER-SYNCHROTRON RADIATION STUDY, Applied physics letters, 70(7), 1997, pp. 895-897
Combining the use of a UV storage ring free electron laser and of sync
hrotron radiation, a time resolved core level spectroscopy study has b
een performed on photoexcited Si(lll)2x1 surfaces with subnanosecond r
esolution. This enabled us to measure band bending fluctuations, cause
d by surface carrier dynamics, during the first nanosecond after photo
excitation; differences in the Si2p core level lineshape, dependent on
the pump-probe time delay, were also observed. The presence of defect
s was found to reduce the fluctuations and make the carrier recombinat
ion process faster. (C) 1997 American Institute of Physics.