K. Nallamshetty et Ma. Angadi, PERPENDICULAR ELECTRICAL-CONDUCTION IN CU MN MULTILAYER FILMS/, Materials science & engineering. B, Solid-state materials for advanced technology, 23(1), 1994, pp. 120000001-120000004
The electrical resistivity and the temperature coefficient of resistan
ce (TCR) of Cu/Mn multilayer films have been studied in the temperatur
e range 295-483 K. Two sets of films are investigated, one with consta
nt number of double layers and increasing bilayer wavelength Lambda in
the range 4-12 nm, and the other with constant Lambda and varying num
ber of double layers n in the range 5-30. The bilayer wavelength depen
dence of room temperature resistivity rho(RT) and TCR exhibits oscilla
tory behaviour. The TCR is found to be proportional to the inverse of
the bilayer wavelength. The experimental results are analysed in the l
ight of Mayadas-Shatzkes model.