SURFACE-MORPHOLOGY AND ROUGHNESS OF TIO2 THIN-FILMS INVESTIGATED WITHSCANNING FORCE MICROSCOPY

Authors
GUTMANNSBAUER W HAEFKE H RUETSCHI M GUNTHERODT HJ STAUB J BANGE K
Citation
W. Gutmannsbauer et al., SURFACE-MORPHOLOGY AND ROUGHNESS OF TIO2 THIN-FILMS INVESTIGATED WITHSCANNING FORCE MICROSCOPY, Helvetica Physica Acta, 66(7-8), 1993, pp. 877-878
Citations number
4
Categorie Soggetti
Physics
Journal title
Helvetica Physica Acta → ACNP
ISSN journal
00180238
Volume
66
Issue
7-8
Year of publication
1993
Pages
877 - 878
Database
ISI
SICI code
0018-0238(1993)66:7-8<877:SAROTT>2.0.ZU;2-0