A photon scanning tunneling microscope (PSTM) using an incoherent poly
chromatic light source has been constructed and used to image submicro
nic structures in a constant intensity mode. The experimental values o
f the penetration depth of the incident electromagnetic field of the s
ystem are in good agreement with the theoretical values obtained with
a three-media model. This new method for operating a PSTM offers a wid
e range of applications: determination of local indexes of refraction
or local spectroscopies.