CHEMICAL-STATE DETERMINATION BY COMBINED X-RAY EXCITED AUGER AND PHOTOELECTRON SPECTROSCOPIES

X-ray excited core level binding and Auger kinetic energies have been measured and the Auger-parameter values derived for a series of silico n, aluminium and titanium compounds and have been compared with the co rresponding literature data. In this connection the usefulness of the two-dimensional representation of the data in the chemical state deter mination is widely demonstrated. In the case of amorphous systems (Cr- Si-O, sialons, Si-organic polymers), for which diffraction techniques are not applicable, the Auger parameter approach can serve a unique to ol for determining the chemical structure.