M. Vrana et al., BRAGG-DIFFRACTION OPTICS IN HIGH-RESOLUTION STRAIN-MEASUREMENTS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 338(1), 1994, pp. 125-131
Using Bragg diffraction optics focusing conditions for a triple-axis s
etup equipped with a bent Si single crystal monochromator and analyzer
for investigation of stress fields in polycrystalline materials are d
erived. Results of experimental tests of such a setup are presented. F
urther it is demonstrated that if certain focusing conditions for a be
nt monochromator are fulfilled the beam diffracted by a polycrystallin
e sample becomes quasi-parallel which enables high resolution measurem
ents directly with a PSD without the use of a collimator or a crystal-
analyzer. In the three axis setup maximum sensitivity in determination
of Delta d/d less than or equal to 10(-4) can be achieved permitting
profile-broadening analysis for reasonable sample volumes and counting
times.