DIELECTRIC LOSSES TAKEN INTO ACCOUNT IN MEASUREMENTS OF THE RESISTIVITY OF SEMICONDUCTORS BY THE CONTACTLESS HF METHOD

Authors
VLASOV VN KRUPNYI AI
Citation
Vn. Vlasov et Ai. Krupnyi, DIELECTRIC LOSSES TAKEN INTO ACCOUNT IN MEASUREMENTS OF THE RESISTIVITY OF SEMICONDUCTORS BY THE CONTACTLESS HF METHOD, Industrial laboratory, 59(2), 1993, pp. 177-179
Citations number
4
Categorie Soggetti
Material Science","Metallurgy & Mining
Journal title
Industrial laboratory → ACNP
ISSN journal
00198447
Volume
59
Issue
2
Year of publication
1993
Pages
177 - 179
Database
ISI
SICI code
0019-8447(1993)59:2<177:DLTIAI>2.0.ZU;2-#