GIGAHERTZ SWITCHING BEHAVIOR OF POLARIZATION-BISTABLE INGAASP INP LASERS UNDER HIGH-FREQUENCY CURRENT MODULATION/

Citation
A. Klehr et al., GIGAHERTZ SWITCHING BEHAVIOR OF POLARIZATION-BISTABLE INGAASP INP LASERS UNDER HIGH-FREQUENCY CURRENT MODULATION/, Applied physics letters, 64(7), 1994, pp. 830-832
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
7
Year of publication
1994
Pages
830 - 832
Database
ISI
SICI code
0003-6951(1994)64:7<830:GSBOPI>2.0.ZU;2-Q
Abstract
The switching dynamics between TE- and TM-polarization states is studi ed in a strained ridge-waveguide InGaAsP/InP laser that exhibits TE/TM bistability. Using current modulation with frequencies between 50 and 500 MHz, three types of emission are distinguished. With increasing m odulation amplitude, the laser runs through a region of TE emission, a range of stochastic switching between TE and TM modes, and a third re gion of regular polarization switching. The minimum modulation amplitu de for regular switching rises strongly with frequency while the respe ctive switching times decrease from about 700 ps at 50 MHz down to 250 ps around 500 MHz, corresponding to gigahertz mode switching.