EMANATION THERMAL-ANALYSIS IN THE CHARACTERIZATION OF ZINC-SULFIDE THIN-FILMS PREPARED FROM DIFFERENT PRECURSORS

Citation
V. Balek et al., EMANATION THERMAL-ANALYSIS IN THE CHARACTERIZATION OF ZINC-SULFIDE THIN-FILMS PREPARED FROM DIFFERENT PRECURSORS, Journal of materials research, 9(1), 1994, pp. 119-124
Citations number
17
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
9
Issue
1
Year of publication
1994
Pages
119 - 124
Database
ISI
SICI code
0884-2914(1994)9:1<119:ETITCO>2.0.ZU;2-3
Abstract
Zinc sulfide thin films were prepared by the Atomic Layer Epitaxy (ALE ) process from zinc acetate and zinc chloride and studied by emanation thermal analysis (ETA). The effects of different precursors and growt h temperatures were evident in the ETA curves. In the films grown from zinc acetate, thermally induced changes were detected below 95 degree s C and above 400 degrees C which can plausibly be attributed to a hig her amount of volatiles and to a polymorphic transition, respectively. The cubic to hexagonal transition was confirmed by DSC. Doping with t erbium distorts the crystal structure and causes the peaks to become p oorly discernible.