R. Jeyakumar et al., ELECTROCHEMICAL PREPARATION AND CHARACTERIZATION OF COPPER INDIUM DISELENIDE THIN-FILMS, Materials research bulletin, 29(2), 1994, pp. 195-202
Thin polycrystalline CuInSe2 films were cathodically deposited on tita
nium and SnO2 coated glass at potentials ranging from -350 MV to -750
mV vs SCE from aqueous sulphate bath using citric acid as complexing a
gent. The films were annealed at 425-degrees-C in an argon atmosphere
and characterised by X-ray diffraction and EPMA. From the XRD analysis
the structure of the film was found to be tetragonal. The composition
of the as deposited film was found to be 1:1:2 by EPMA. From the opti
cal studies the band gap was found to be 1.02 eV. All the as deposited
films were found to be p-type. On post heat treatment at 425-degrees-
C the films deposited at or above -650 mV changed to n-type whereas be
low -650 mV p-type films only were obtained.