Tr. Weatherford et al., SEU RATE PREDICTION AND MEASUREMENT OF GAAS SRAMS ONBOARD THE CRRES SATELLITE, IEEE transactions on nuclear science, 40(6), 1993, pp. 1463-1470
An analysis is presented on SPICE predicted, SEU ground tested, and CR
RES observed heavy ion and proton soft error rates of GaAs SRAMs. Upse
t rates overestimated the susceptibility of the GaAs SRAMs. Difference
s are accounted to several factors.