MONITORING SEU PARAMETERS AT REDUCED BIAS

Authors
ROTH DR MCNULTY PJ ABDELKADER WG STRAUSS L STASSINOPOULOS EG
Citation
Dr. Roth et al., MONITORING SEU PARAMETERS AT REDUCED BIAS, IEEE transactions on nuclear science, 40(6), 1993, pp. 1721-1724
Citations number
8
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
40
Issue
6
Year of publication
1993
Part
1
Pages
1721 - 1724
Database
ISI
SICI code
0018-9499(1993)40:6<1721:MSPARB>2.0.ZU;2-Q
Abstract
SEU sensitivity of a CMOS SRAM increases with decreasing bias in such a manner that the critical charge exhibits a linear dependence on bias . This should allow proton and neutron monitoring of SEU parameters ev en for radiation hardened devices. The sensitivity of SEU rates to the thickness of the. sensitive volume is demonstrated and procedures for determining the SEU parameters using protons are outlined.