CHARGE COLLECTION SPECTROSCOPY

Authors
REED RA MCNULTY PJ BEAUVAIS WJ ROTH DR
Citation
Ra. Reed et al., CHARGE COLLECTION SPECTROSCOPY, IEEE transactions on nuclear science, 40(6), 1993, pp. 1880-1887
Citations number
8
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
40
Issue
6
Year of publication
1993
Part
1
Pages
1880 - 1887
Database
ISI
SICI code
0018-9499(1993)40:6<1880:CCS>2.0.ZU;2-1
Abstract
Monitoring pulses measured between the power pins of a microelectronic device exposed to high LET ions yields important information on the S EU response of the circuit. Analysis is complicated for p-well CMOS de vices by the possibility of competition between junctions, but the res ults suggest that charge collection measurements are still sufficient to determine SEU parameters accurately.