SURFACE INVESTIGATIONS OF SILYLATED SUBSTRATES BY TOF-SIMS

Authors
HAGENHOFF B BENNINGHOVEN A STOPPEKLANGNER K GROBE J
Citation
B. Hagenhoff et al., SURFACE INVESTIGATIONS OF SILYLATED SUBSTRATES BY TOF-SIMS, Advanced materials, 6(2), 1994, pp. 142-144
Citations number
17
Categorie Soggetti
Material Science
Journal title
Advanced materials → ACNP
ISSN journal
09359648
Volume
6
Issue
2
Year of publication
1994
Pages
142 - 144
Database
ISI
SICI code
0935-9648(1994)6:2<142:SIOSSB>2.0.ZU;2-5
Abstract
Organosilicon compounds have found widespread use as protective coatin gs, especially against corrosive surface phenomena. TOF-SIMS data are presented here that help to elucidate the products formed when organos ilicon agents are coupled to oxidic surfaces. Evidence is found for si lsesquioxanes and their homo-derivatives (see Figure). whose synthesis normally requires special preparative conditions.