SOFT-X-RAY SPECTRA OF HIGHLY IONIZED ELEMENTS WITH ATOMIC NUMBERS RANGING FROM 57 TO 82 PRODUCED BY COMPACT LASERS

Citation
Gm. Zeng et al., SOFT-X-RAY SPECTRA OF HIGHLY IONIZED ELEMENTS WITH ATOMIC NUMBERS RANGING FROM 57 TO 82 PRODUCED BY COMPACT LASERS, Journal of applied physics, 75(4), 1994, pp. 1923-1930
Citations number
26
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
75
Issue
4
Year of publication
1994
Pages
1923 - 1930
Database
ISI
SICI code
0021-8979(1994)75:4<1923:SSOHIE>2.0.ZU;2-C
Abstract
X-ray emission spectra in the spectral range of 2-13 nm from 19 kinds of material with high atomic numbers (lanthanum through lead) were rec orded with a grazing incidence spectrometer equipped with a microchann el plate detector. There is an intense, narrow spectral band in these spectra which shifts toward shorter wavelength and becomes weak in int ensity with increasing atomic number. The materials were irradiated ei ther by a 4 J/35 ns slab Nd:glass laser or by a 0.5 J/8 ns Nd:YAG lase r. The absolute photon intensities of the spectra were determined with an absolutely calibrated charge coupled device camera. The peak spect ral brightness of the emission at the peak intensity of the spectral b and for lanthanum plasma was estimated to be 2.1 X 10(16) photons/s/mm 2/mrad2 in 0.1% bandwidth. The origin of the narrow, intense spectral bands in the recorded spectra and their dependence on target materials and laser wavelength are interpreted.