Md. Lampert et al., POSITION-DEPENDENT ELECTRONIC-PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON P-I-N-DIODES, Journal of applied physics, 75(4), 1994, pp. 2110-2114
A new theoretical insight in the dynamics of position-dependent deep t
rapping within the p/i-interface region of a-Si:H p-i-n diodes is pres
ented. The positive space charge in this region relates internal elect
ric field and deep trapping electron lifetime profiles with each other
. A hyperbolic field dependence and a position-independent capture con
stant can explain well the experimental delayed field time of flight r
esults.