Rp. Leavitt et al., QUANTITATIVE MODEL FOR PHOTOCURRENT SPECTROSCOPY OF QUANTUM-WELL DIODES INCLUDING TRANSIT-TIME AND BACKGROUND-DOPING EFFECTS, Journal of applied physics, 75(4), 1994, pp. 2215-2226
We present a simple model for photocurrent spectroscopy of quantum-wel
l p-i-n diodes that provides a quantitatively accurate desciption of t
he dependence of photocurrent on absorption coefficient and applied bi
as. The model incorporates the transit-time effect described previousl
y [R. P. Leavitt and J L. Bradshaw, Appl. Phys. Lett 59, 2433) (1991)]
as a limiting case. It also includes the two major effects of residua
l background doping in the intrinsic region of the diode: nonuniform e
lectric fields, which affect the transport of carriers, and incomplete
depletion at low electric fields, which reduces the amount of photocu
rrent collected. We show that the background-doping effect alone can m
imic the transit-time effects: reduction in the overall carrier collec
tion efficiency, saturation of photocurrent spectral features, and the
presence of minima in photocurrent where absorption spectra show maxi
ma. We obtain a closed-form expression for the photocurrent in the gen
eral case where both transit-time and background-doping effects are si
gnificant. Excellent agreement is obtained between model calculations
and experimental room-temperature photocurrent spectra for an 89-perio
d 100-angstrom GaAs/100-angstrom Al0.3Ga0.7As multiple-quantum-well di
ode, where the background doping density, the effective electron mobil
ity, and the built-in potential are treated as adjustable parameters.
The background doping density and the built-in potential obtained from
the fit are in excellent agreement with independent measurements. We
applied the model to predict the dependence of photocurrent on the int
rinsic-region thickness of the diode. We also show a dramatic asymmetr
y between photocurrent spectra measured with light incident from the f
ront and from the back of the diode, and we discuss the impact of this
asymmetry on the performance of self-electro-optic-effect devices. We
also find good agreement between the model predictions and the photoc
urrent results of Whitehead et al. [Appl. Phys. Lett. 52, 345 ( 1988)]
. Further, our model qualitatively describes the dependence of the pho
toluminescence intensity on electric fields in multiple-quantum-well p
-i-n diodes.