AN ALGORITHM TO ESTIMATE THE FRACTION DEFECTIVE AND THE EXPONENTIAL MEAN-LIFE USING UNLABELED SAMPLES

Authors
LI TF CHANG SW
Citation
Tf. Li et Sw. Chang, AN ALGORITHM TO ESTIMATE THE FRACTION DEFECTIVE AND THE EXPONENTIAL MEAN-LIFE USING UNLABELED SAMPLES, Information processing letters, 49(3), 1994, pp. 129-133
Citations number
9
Categorie Soggetti
Information Science & Library Science","Computer Science Information Systems
Journal title
Information processing letters → ACNP
ISSN journal
00200190
Volume
49
Issue
3
Year of publication
1994
Pages
129 - 133
Database
ISI
SICI code
0020-0190(1994)49:3<129:AATETF>2.0.ZU;2-K
Abstract
A method is presented to estimate the percentages and the exponential mean lifetimes of products from two manufacturing processes using a mi xture of unlabeled samples. The results of a Monte Carlo study are pre sented to demonstrate the accuracy of the estimation method. All estim ates will converge to the true unknown parameters (percentages and mea n lifetimes) when the size of the unlabeled sample increases.