DIAGNOSIS BY SIGNATURE ANALYSIS OF TEST RESPONSES

Authors
KARPOVSKY MG LEVITIN LB VAINSTEIN FS
Citation
Mg. Karpovsky et al., DIAGNOSIS BY SIGNATURE ANALYSIS OF TEST RESPONSES, I.E.E.E. transactions on computers, 43(2), 1994, pp. 141-152
Citations number
20
Categorie Soggetti
Computer Sciences","Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture
Journal title
I.E.E.E. transactions on computers → ACNP
ISSN journal
00189340
Volume
43
Issue
2
Year of publication
1994
Pages
141 - 152
Database
ISI
SICI code
0018-9340(1994)43:2<141:DBSAOT>2.0.ZU;2-#
Abstract
We propose a new approach for identification of faulty processing elem ents based on an analysis of the compressed test response of the syste m. The test response is compressed first in space and then in time, an d faulty processing elements are identified by hard decision decoding of the corresponding spacetime signature. The approach results in cons iderable savings in hardware required for diagnostics.